The new D8 ADVANCE X-ray diffractometer from Brooke AXS company adopts a creative da Vinci design and successfully achieves fully automatic switching between qualitative and quantitative analysis under BB focusing geometry and thin film grazing incidence GID analysis and thin film reflectivity XRR analysis under parallel light geometry through TWIN-TWIN optical path design, without the need for light. Through the revolutionary TWIST TUBE technology, users can switch from linear light source applications (qualitative and quantitative analysis of conventional powders, GID of thin films, XRR) to point light source applications (texture, stress, micro area) in just one minute, making annoying issues such as light path swapping and re alignment a thing of the past!

A high-precision angle measuring instrument can ensure that the error between the measured peak position and the standard peak position of each diffraction peak (note that it is not a single diffraction peak) in the full spectrum range does not exceed 0.01 degrees. Brooke AXS provides a global guarantee!

The advanced Linx array detector can increase the intensity by 150 times, not only improving the efficiency of equipment use, but also significantly enhancing the detection sensitivity of the equipment.

Technical indicators:

Theta/theta vertical angle measuring instrument

2Theta angle range:- 110~168°

Angle accuracy: 0.0001 degrees

Cr/Co/Cu target, standard size light tube

Detector: Link Array Detector, Link XE Array Detector

Instrument size: 1868x1300x1135mm

Weight: 770kg

application

Qualitative analysis of physical phase

Analysis of crystallinity and amorphous phase content

Structural refinement and analysis

quantitative phase analysis

Accurate measurement of lattice parameters

Quantitative analysis without standard samples

Microscopic strain analysis

Grain size analysis

In situ analysis

Residual stress

Measurement of low angle mesoporous materials

Texture and ODF analysis

Thin film grazing incidence

Measurement of film reflectivity

small angle X-ray scattering